2026
- Challenges and Perspectives in Advanced CMOS & 5.5D Packaging: Design, Reliability and Security. Proceedings of the Conference on Design, Automation & Test in Europe (DATE'26), 2026 more…
- Revealing the Impact of Parasitic Effects on CFET Reliability and Performance Across Devices, Standard Cells, and Circuits. Proceedings of the IEEE 60th International Reliability Physics Symposium (IRPS'26), 2026 more…
- Si-GT: Fast Interconnect Signal Integrity Analysis for Integrated Circuit Design via Graph Transformers. The Fourteenth International Conference on Learning Representations (ICLR'26), 2026 more…
- Validating Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG. IEEE Latin American Test Symposium (LATS'26), 2026 more…
- Power Side-Channel Attacks in Nanosheet Circuits. Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS'26), 2026 more…
- Securing Hyper-Dimensional Computing: A Locking Mechanism with FPGA Implementation. International Conference on Information Systems Security and Privacy (ICISSP'26), 2026 more…
- Soft Error Analysis in Nanosheet and Forksheet Transistors: From Device Physics to Circuit and Memory Impact. IEEE Transactions on Electron Devices (TED), 2026 more…
2025
- Improved On Resistance of Cryogenic LDMOS Devices Utilizing a Field Plate for Scaling Up Trapped Ion Quantum Computers. 71st Annual IEEE International Electron Devices Meeting (IEDM'25), 2025 more…
- Spike-RISC: Algorithm/ISA Co-Optimization for Efficient SNNs on RISC-V. The Multidisciplinary Open Access Journal IEEE Access (IEEE Access), 2025 more…
- Energy-Efficient Cryogenic Ternary Content Addressable Memory using Ferroelectric SQUID. Nature Partner Journals Unconventional Computing (npj Unconv. Comput.), 2025 more…
- SRAM Beyond FinFET: Performance and Aging Challenges in Nanosheet and CFET. IEEE Computer Society Annual Symposium on VLSI (ISVLSI'25), 2025 more…
- Monolithic 3D SRAMs using Thin-Film Transistors: Opportunities and Challenges. 71st Annual IEEE International Electron Devices Meeting (IEDM'25), 2025 more…
- Frontiers in Edge AI with RISC-V: Quantized Neural Networks vs. Hyperdimensional Computing. Proceedings of the Conference on Design, Automation & Test in Europe (DATE'25), 2025 more…
- Dual-Bit FeFET for Enhanced Storage and Endurance. Nature Unconventional Computing (npj Unconv. Comput.), 2025 more…
- Investigating Self-Heating Effects in Ferroelectric FinFETs for Reliable In-Memory Computing. IEEE Journal of the Electron Devices Society (J-EDS), 2025 more…
- Impact of Aging, Self-Heating and Parasitics Effects on NSFET and CFET. IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JXCDC), 2025 more…
- A Comprehensive Investigation of Cryogenic Aging in 28nm CMOS: Suppression of BTI and HCD in Circuits and SRAM. Proceedings of the IEEE 61st International Reliability Physics Symposium (IRPS'25), 2025 more…
- TransHD: Spatial Transformer Features Extraction for HDC Synergetic Learning. IEEE Transactions on Emerging Topics in Computing (TETC), 2025 more…
- Small Delay Fault Testing with Multiple Voltages under Variations: Defect vs. Fault Coverage. Journal of Electronic Testing(JETT), 2025 more…
- Robust DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage. IEEE Latin American Test Symposium (LATS'24), 2025 more…
- Performance Evaluation of 6T-SRAM in Sub-3 nm Complementary FET. IEEE Electron Devices Technology & Manufacturing Conference (EDTM'25), 2025 more…
- Beyond FinFETs: Transistor-to-GDS Benchmarking of AI Accelerators using Nanosheets and CFETs. IEEE International Symposium on VLSI Design, Automation and Test (VLSI-TSA'25), 2025 more…
- First Demonstration of Ferroelectric Digital In-Memory Computing for Scalable, Reliable and Ultra-Efficient Similarity Computation. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2025 more…
- Benchmarking Cryogenic Circuits Using 5 nm FinFETs for Quantum Processing. Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS'25), 2025 more…
- Kolmogorov-Arnold Network for Transistor Compact Modeling. Advanced Intelligent Systems, 2025 more…
- Dual Neural Network Framework with SPICE Integration for Fast and Accurate Transistor Modeling. Advanced Intelligent Systems, 2025 more…
- Carbon-Efficient 3D DNN Acceleration: Optimizing Performance and Sustainability. IEEE Computer Society Annual Symposium on VLSI (ISVLSI'25), 2025 more…
- Modeling and Evaluating Superconducting Ferroelectric SQUID Circuits. IEEE Transactions on Quantum Engineering (TQE'25), 2025 more…
- Cryogenic Hyper-Dimensional In-Memory Computing using Ferroelectric TCAM. IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JXCDC), 2025 more…
- Unveiling Enhanced Trade-offs in SRAM-based Memory Array for Cryogenic CMOS Technology. IEEE Transactions on Quantum Engineering (TQE), 2025 more…
- A PUF-based Obfuscation Scheme For In-Memory Architectures. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2025 more…
- Heterogeneous Integration of Advanced CMOS and Emerging Memories: Challenges and Solutions. IEEE European Test Symposium (ETS'25), 2025 more…
- Cryo-CACTI: Cryogenic-Aware CACTI for Cache Modeling down to 10K in Advanced 7nm FinFETs. IEEE Transactions on Computers (TC), 2025 more…
- Evaluation of Radiation Resilience, Performance, and Vmin of Sub-3nm FSFET based SRAM Arrays. IEEE Transactions on Computers (TC), 2025 more…
- A Comprehensive Vmin Characterization of 5 nm FinFET-based SRAM at Cryogenic Temperatures. IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JXCDC), 2025 more…
- Workload Compression Techniques to scale Defect-Centric BTI Models to the Circuit Level. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2025 more…
- CFET Beyond 3~nm: SRAM Reliability under Design-Time and Run-Time Variability. IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JXCDC), 2025 more…
- Accelerating Reliability Analysis for Aging and Self-heating using Machine Learning. 26th International Symposium on Quality Electronic Design (ISQED'25), 2025 more…
- BEOL Interconnects for 2nm Technology Node and Beyond. Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI'25), 2025 more…
- ML-driven Self-Heating Analysis from Individual Transistors to Large IP Circuits. IEEE Access (IEEE Access), 2025 more…
- Self-Aware Silicon: Enhancing Lifecycle Management with Intelligent Testing an Data Insightsn. IEEE European Test Symposium (ETS'25), 2025 more…
- Domain-specific Hyperdimensional RISC-V Processor for Edge-AI Training. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2025 more…
- Capacitor Minimization in Analog Synapses for Efficient and Compact Binarized SNNs. IEEE Transactions on Circuits and Systems for Artificial Intelligence (TCAS-AI), 2025 more…
- Leveraging Highly Approximated Multipliers in DNN Inference. IEEE Access, 2025, 1-1 more… Full text ( DOI )
2024
- On the Effectiveness of Logic Locking for IP Protection of Tree-based Machine Learning. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2024 more…
- Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor. Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24), 2024 more…
- Unveiling the Hidden Impact of Self-Heating on Ferroelectric FinFET and FDSOI based In-Memory Computing. IEEE Electron Devices Technology & Manufacturing Conference (EDTM'24), 2024 more…
- Temperature- and Variability-Aware Compact Modeling of Ferroelectric FDSOI FET for Memory and Emerging Applications. Solid-State Electronics (SSE'24), 2024 more…
- In-Memory Acceleration of Hyperdimensional Genome Matching on Unreliable Emerging Technologies. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2024 more… Full text ( DOI )
- Frontiers in Edge AI with RISC-V: Quantized Neural Networks vs. Hyperdimensional Computing. Proceedings of the Conference on Design, Automation & Test in Europe (DATE'24), 2024 more…
- CircuitHD: Brain-inspired Hyperdimensional Computing for Circuit Recognition. The Multidisciplinary Open Access Journal IEEE Access (IEEE Access), 2024 more…
- HDCircuit: Brain-inspired Hyperdimensional Computing for Circuit Recognition. Proceedings of the Conference on Design, Automation & Test in Europe (DATE), 2024 more…
- Technology/Algorithm Co-design for Reliable Energy-efficient NVM-based Hyperdimensional Computing under Voltage Scaling. Proceedings of the Conference on Design, Automation & Test in Europe (DATE'24), 2024 more…
- Technology Mapping for Cryogenic CMOS Circuits. IEEE Computer Society Annual Symposium on VLSI (ISVLSI'24), 2024 more…
- Printed 2D-Temperature Sensor Arrays for Integrated CPU Monitoring. Advanced Materials Technologies, 2024 more…
- Vmin Testing under Variations: Defect versus Fault Coverage. IEEE Latin American Test Symposium (LATS'24), 2024 more…
- Time and Space Optimized Storage-based BIST under Multiple Voltages and Process Variations. IEEE European Test Symposium (ETS'24), 2024 more…
- Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing. IEEE International Test Conference (ITC'24), 2024 more…
- Innovations in Hardware Security: Leveraging FeFET Technology for Future Opportunities. Proceedings of IEEE Asia Pacific Conference on Circuits and Systems (APCCAS'24), 2024 more…
- On the Severity of Self-Heating in FDSOI at Cryogenic Temperatures: In-depth analysis from Transistors to Full Processor. Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24), 2024 more…
- Ferroelectric Transistors in Monolithic 3D Integration: Reliable DNN Acceleration in the Face of Temperature. Advanced Intelligent Systems, 2024 more…
- Monolithic 3D Integration using BEOL FeFET: Reliability, Thermal Effects, and DNN Accuracy. IEEE Electron Devices Technology & Manufacturing Conference (EDTM'24), 2024 more…
- A Physics-Based Model for Oxide-Semiconductor-Based Ferroelectric Field-Effect Transistors. IEEE Transactions on Electron Devices (TED), 2024 more…
- Algorithm to Technology Co-Optimization for CiM-based Hyperdimensional Computing. Proceedings of the Conference on Design, Automation & Test in Europe (DATE), 2024 more…
- Optimized Detection of Marginal Defects in Standard Cells Using Unsupervised Learning. IEEE The 33rd Asian Test Symposium (ATS'24), 2024 more…
- WaSSaBi: Wafer Selection with Self-supervised Representations and Brain-inspired Active Learning. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2024 more…
- Impact of Self-Heating in 5 nm FinFETs at Cryogenic Temperatures for Reliable Quantum Computing: Device-Circuit Interaction. Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24), 2024 more…
- Novel Trade-offs in 5nm FinFET SRAM Arrays at Extreme Low Temperatures. IEEE Transactions on Quantum Engineering (TQE), 2024 more…
- CAPE: Criticality-Aware Performance and Energy Optimization Policy for NCFET-based Caches. IEEE Transactions on Computers (TC), 2024 more…
- Exploring BTI Aging Effects on Spatial Power Density and Temperature Profiles of VLSI Chips. Integration, 2024 more…
- Benchmarking IWO-based Logic Circuits for Monolithic 3D Integration. IEEE Electron Devices Technology & Manufacturing Conference (EDTM'24), 2024 more…
- Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2024 more…
- Low Power and Temperature-Resilient Compute-In-Memory Based on Subthreshold-FeFET. Proceedings of the Conference on Design, Automation & Test in Europe (DATE), 2024 more…
- TReCiM: Lower Power and Temperature-Resilient Multibit 2FeFET-1T Compute-in-Memory Design. IEEE/ACM 42nd International Conference on Computer-Aided Design (ICCAD'24), 2024 more…
2023
- Beyond von Neumann Era: Brain-Inspired Hyperdimensional Computing to the Rescue. 28th Asia and South Pacific Design Automation Conference (ASP-DAC), 2023 more… Full text ( DOI )
- ML to the Rescue: Reliability Estimation from Self-Heating and Aging in Transistors All the Way up Processors. 28th Asia and South Pacific Design Automation Conference (ASP-DAC), 2023 more… Full text ( DOI )
- HDGIM: Hyperdimensional Genome Sequence Matching on Unreliable highly scaled FeFET. 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023 more… Full text ( DOI )
- Energy-efficient Computation-In-Memory Architecture using Emerging Technologies. Proceedings of the IEEE International Conference on Mechatronics (ICM'23), 2023 more…
- Programmable Delay Element using Dual-Port FeFET for Post-Silicon Clock Tuning. IEEE Electron Device Letters (EDL) PP, 2023, 1-1 more… Full text ( DOI )
- Defying Temperature: Reliable Compute-in-Memory in Monolithic 3D using BEOL Ferroelectric TFT. 69th Annual IEEE International Electron Devices Meeting (IEDM), 2023 more…
- HW/SW Codesign for Approximation-Aware Binary Neural Networks. IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS) 13 (1), 2023, 33-47 more… Full text ( DOI )
- Reliable Hyperdimensional Reasoning on Unreliable Emerging Technologies. IEEE/ACM 42nd International Conference on Computer-Aided Design (ICCAD), 2023 more…
- Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine Learning. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) 70 (9), 2023, 3699-3711 more… Full text ( DOI )
- Cryogenic Embedded System to Support Quantum Computing: From 5-nm FinFET to Full Processor. IEEE Transactions on Quantum Engineering (IQE) 4, 2023, 1-11 more… Full text ( DOI )
- Tutorial: The Synergy of Hyperdimensional and In-memory Computing. International Conference on Hardware/Software Codesign and System Synthesis (CODES/ISSS ), 2023 more…
- SyncTREE: Fast Timing Analysis for Integrated Circuit Design through a Physics-informed Tree-based Graph Neural Network. Thirty-seventh Conference on Neural Information Processing Systems (NeurIPS), 2023 more…
- Robust Pattern Generation for Small Delay Faults under Process Variations. IEEE International Test Conference (ITC), 2023 more…
- Evaluating the Robustness of Complementary Channel Ferroelectric FETs Against Total Ionizing Dose Towards Radiation-Tolerant Embedded Nonvolatile Memory. IEEE Electron Device Letters (EDL) PP, 2023, 1-1 more… Full text ( DOI )
- Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows. 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023 more… Full text ( DOI )
- Transistor Self-Heating-Aware Synthesis for Reliable Digital Circuit Designs. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) PP, 2023, 1-14 more… Full text ( DOI )
- Stress-Resiliency of AI Implementations on FPGAs. 33rd International Conference on Field-Programmable Logic and Applications (FPL), 2023 more… Full text ( DOI )
- Nontraditional Design of Dynamic Logics Using FDSOI for Ultra-Efficient Computing. IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JXCDC) 9 (1), 2023, 74-82 more… Full text ( DOI )
- Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) 70 (7), 2023, 2891-2903 more… Full text ( DOI )
- Ultra-Efficient Edge AI using FeFET-based Monolithic 3D Integration. IEEE/ACM 42nd International Conference on Computer-Aided Design (ICCAD), 2023 more…
- Frontiers in AI Acceleration: From Brain-inspired Computing to Monolithic 3D Integration. 31th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), 2023 more…
- BEOL FeFET SPICE-Compatible Model for Benchmarking 3-D Monolithic In-Memory TCAM Computation. IEEE Transactions on Electron Devices (TED) PP, 2023, 1-7 more… Full text ( DOI )
- Comprehensive Modeling of Switching Behavior in BEOL FeFET for Monolithic 3-D Integration. IEEE Transactions on Electron Devices (TED) PP, 2023, 1-6 more… Full text ( DOI )
- Compact and High-Performance TCAM Based on Scaled Double-Gate FeFETs. Proceedings of the 60th Annual Design Automation Conference (DAC), 2023 more… Full text ( DOI )
- FDSOI-Based Analog Computing for Ultra-Efficient Hamming Distance Similarity Calculation. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) PP, 2023, 1-10 more… Full text ( DOI )
- Temperature-Aware Memory Mapping and Active Cooling of Neural Processing Units. IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), 2023 more… Full text ( DOI )
- Approximation-Aware and Quantization-Aware Training for Graph Neural Networks. IEEE Transactions on Computers (TC), 2023 more… Full text ( DOI )
- ML-TCAD: Perspectives and Challenges on Accelerating Transistor Modeling using ML. ACM/IEEE 5th Workshop on Machine Learning for CAD (MLCAD), 2023 more… Full text ( DOI )
- 5nm FinFET Cryogenic SRAM Evaluation for Quantum Computing. 2023 Device Research Conference (DRC), 2023 more… Full text ( DOI )
- Modeling and Benchmarking 5nm Ferroelectric FinFET from Room Temperature down to Cryogenic Temperatures. IEEE 23rd International Conference on Nanotechnology (NANO), 2023 more… Full text ( DOI )
- Cryogenic In-Memory Computing for Quantum Processors Using Commercial 5nm FinFETs. IEEE Open Journal of Circuits and Systems (OJCAS) PP, 2023, 1-1 more… Full text ( DOI )
- Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) PP, 2023, 1-14 more… Full text ( DOI )
- Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness. 2023 IEEE International Reliability Physics Symposium (IRPS), 2023 more… Full text ( DOI )
- Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning. 2023 IEEE International Symposium on Circuits and Systems (ISCAS), 2023 more… Full text ( DOI )
- Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level. 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023 more… Full text ( DOI )
- Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI) 31 (9), 2023, 1280-1293 more… Full text ( DOI )
- Long-Term Aging Impacts on Spatial On-Chip Power Density and Temperature. 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2023 more… Full text ( DOI )
- Modeling and Investigating Total Ionizing Dose Impact on FeFET. IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JXCDC) PP, 2023, 1-1 more… Full text ( DOI )
- First demonstration of in-memory computing crossbar using multi-level Cell FeFET. Nature Communications 14, 2023 more… Full text ( DOI )
- Golden-Free Robust Age Estimation to Triage Recycled ICs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) PP, 2023, 1-1 more… Full text ( DOI )
- Analysis and Characterization of Defects in FeFETs. IEEE International Test Conference (ITC), 2023 more…
- FeFET Reliability Modeling for In-Memory Computing: Challenges, Perspective, and Emerging Trends. IEEE Transactions on Electron Devices (TED) PP, 2023, 1-7 more… Full text ( DOI )
- HW/SW Co-Design for Reliable TCAM- Based In-Memory Brain-Inspired Hyperdimensional Computing. IEEE Transactions on Computers (TC) 72 (8), 2023, 2404–2417 more… Full text ( DOI )
- Reliable FeFET-based Neuromorphic Computing through Joint Modeling of Cycle-to-Cycle Variability, Device-to-Device Variability, and Domain Stochasticity. 2023 IEEE International Reliability Physics Symposium (IRPS), 2023 more… Full text ( DOI )
- Accelerating FeFET Reliability Analysis using Machine Learning. IEEE Transactions on Electron Devices (TED), 2023 more… Full text ( DOI )
- Impact of Non-Volatile Memory Cells on Spiking Neural Network Annealing Machine With In-Situ Synapse Processing. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) PP, 2023, 1-14 more… Full text ( DOI )
- Unlocking Efficiency in BNNs: Global by Local Thresholding for Analog-based HW Accelerators. IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS) PP, 2023, 1-1 more… Full text ( DOI )
- Hyperdimensional Computing for Robust and Efficient Unsupervised Learning. 57th Asilomar Conference on Signals, Systems, and Computers, (Asilomar), 2023 more…
- Powering Disturb-Free Reconfigurable Computing and Tunable Analog Electronics with Dual-Port Ferroelectric FET. ACS Applied Materials & Interfaces (ACS), 2023 more… Full text ( DOI )
- Compact CMOS-Compatible Majority Gate Using Body Biasing in FDSOI Technology. IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS) 13 (1), 2023, 86-95 more… Full text ( DOI )
- Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths. 2023 IEEE International Reliability Physics Symposium (IRPS), 2023 more… Full text ( DOI )
- Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 more… Full text ( DOI )
- Design Automation for Cryogenic CMOS Circuits. Proceedings of the 60th Annual Design Automation Conference (DAC), 2023 more… Full text ( DOI )
0025
- Thermal Challenges beyond FinFET. IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED'25), 0025 more…