Victor van Santen

Dr.-Ing Victor van Santen

Ravipati, Divya; van Santen, Victor; Parihar, Shivendra; Singh Chauhan, Yogesh; Panda, Preeti Ranjan; Amrouch, Hussam: Cryo-CACTI: Cryogenic-Aware CACTI for Cache Modeling down to 10K in Advanced 7nm FinFETs. IEEE Transactions on Computers (TC), 2025 more…
Santana-Andreo, A.; van Santen, V. M.; Castro-Lopez, R.; Roca, E.; Amrouch, H.; Fernandez, F.V.: Workload Compression Techniques to scale Defect-Centric BTI Models to the Circuit Level. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2025 more…

Amrouch, Hussam; van Santen, Victor; Diaz Fortuny, Javier; Klemme, Florian: Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor. Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24), 2024 more…
Hien, Benjamin; Walter, Marcel; van Santen, Victor M.; Klemme, Florian; Parihar, Shivendra Singh; Pahwa, Girish; Chauhan, Yogesh S.; Amrouch, Hussam; Wille, Robert: Technology Mapping for Cryogenic CMOS Circuits. IEEE Computer Society Annual Symposium on VLSI (ISVLSI'24), 2024 more…
Parihar, Shivendra; van Santen, Victor; Thomann, Simon; Chauhan. S, Yogesh; Amrouch, Hussam: Novel Trade-offs in 5nm FinFET SRAM Arrays at Extreme Low Temperatures. IEEE Transactions on Quantum Engineering (TQE), 2024 more…
Ravipati, Divya; Goel, Ramanuj; van Santen, Victor; Amrouch, Hussam; Panda, Preeti Ranjan: CAPE: Criticality-Aware Performance and Energy Optimization Policy for NCFET-based Caches. IEEE Transactions on Computers (TC), 2024 more…
Tarek, Mohamed; van Santen, Victor; Alrahis, Lilas; Sinanoglu, Ozgur; Amrouch, Hussam: Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2024 more…

Parihar, Shivendra; van Santen, Victor; Thomann, Simon; Pahwa, Girish; Chauhan, Yogesh; Amrouch, Hussam: Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) PP, 2023, 1-14 more… Full text ( DOI )
Ravipati, Divya Praneetha; van Santen, Victor M.; Salamin, Sami; Amrouch, Hussam; Panda, Preeti Ranjan: Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI) 31 (9), 2023, 1280-1293 more… Full text ( DOI )
van Santen, Victor; Gata-Romero, Jose; Nunez, Juan; Castro-Lopez, Rafael; Roca, Elisenda; Amrouch, Hussam: Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths. 2023 IEEE International Reliability Physics Symposium (IRPS), 2023 more… Full text ( DOI )
van Santen, Victor; Klemme, Florian; Genssler, Paul; Amrouch, Hussam: Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 more… Full text ( DOI )
van Santen, Victor; Walter, Marcel; Klemme, Florian; Parihar, Shivendra; Pahwa, Girish; Chauhan, Yogesh; Wille, Robert; Amrouch, Hussam: Design Automation for Cryogenic CMOS Circuits. Proceedings of the 60th Annual Design Automation Conference (DAC), 2023 more… Full text ( DOI )