2026
- Revealing the Impact of Parasitic Effects on CFET Reliability and Performance Across Devices, Standard Cells, and Circuits. Proceedings of the IEEE 60th International Reliability Physics Symposium (IRPS'26), 2026 more…
- Power Side-Channel Attacks in Nanosheet Circuits. Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS'26), 2026 more…
2025
- SRAM Beyond FinFET: Performance and Aging Challenges in Nanosheet and CFET. IEEE Computer Society Annual Symposium on VLSI (ISVLSI'25), 2025 more…
- Monolithic 3D SRAMs using Thin-Film Transistors: Opportunities and Challenges. 71st Annual IEEE International Electron Devices Meeting (IEDM'25), 2025 more…
- Frontiers in Edge AI with RISC-V: Quantized Neural Networks vs. Hyperdimensional Computing. Proceedings of the Conference on Design, Automation & Test in Europe (DATE'25), 2025 more…
- Dual-Bit FeFET for Enhanced Storage and Endurance. Nature Unconventional Computing (npj Unconv. Comput.), 2025 more…
- A Comprehensive Investigation of Cryogenic Aging in 28nm CMOS: Suppression of BTI and HCD in Circuits and SRAM. Proceedings of the IEEE 61st International Reliability Physics Symposium (IRPS'25), 2025 more…
- Performance Evaluation of 6T-SRAM in Sub-3 nm Complementary FET. IEEE Electron Devices Technology & Manufacturing Conference (EDTM'25), 2025 more…
- Beyond FinFETs: Transistor-to-GDS Benchmarking of AI Accelerators using Nanosheets and CFETs. IEEE International Symposium on VLSI Design, Automation and Test (VLSI-TSA'25), 2025 more…
- Heterogeneous Integration of Advanced CMOS and Emerging Memories: Challenges and Solutions. IEEE European Test Symposium (ETS'25), 2025 more…
- Evaluation of Radiation Resilience, Performance, and Vmin of Sub-3nm FSFET based SRAM Arrays. IEEE Transactions on Computers (TC), 2025 more…