- Image Restoration via Frequency Selection. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2023 mehr… BibTeX Volltext ( DOI )
- Exploring the Potential of Channel Interactions for Image Restoration. Knowledge-Based Systems, 2023 mehr… BibTeX Volltext ( DOI )
- PSNet: Towards Efficient Image Restoration with Self-Attention. IEEE Robotics and Automation Letters, 2023 mehr… BibTeX Volltext ( DOI ) Volltext (mediaTUM)
- Focal Network for Image Restoration. Proceedings of the IEEE/CVF International Conference on Computer Vision, 2023 mehr… BibTeX Volltext (mediaTUM)
- Dual-domain attention for image deblurring. Proceedings of the AAAI Conference on Artificial Intelligence, 2023 mehr… BibTeX Volltext (mediaTUM)
- Selective Frequency Network for Image Restoration. The Eleventh International Conference on Learning Representations, 2023 mehr… BibTeX Volltext (mediaTUM)
- IRNeXt: Rethinking Convolutional Network Design for Image Restoration. International Conference on Machine Learning, 2023 mehr… BibTeX Volltext (mediaTUM)
- Strip Attention for Image Restoration. International Joint Conference on Artificial Intelligence, IJCAI, 2023 mehr… BibTeX Volltext (mediaTUM)
Yuning Cui
Technical University of Munich
Informatics 6 - Chair of Robotics, Artificial Intelligence and Real-time Systems (Prof. Knoll)
- Office hours: By appointment
- Room: 5607.03.059
- yuning.cui(at)tum.de
Curriculum Vitae
I am a Ph.D. candidate under the supervision of Prof. Knoll since 2021. Previously, I obtained my master degree from National University of Defense Technology, China, in Dec. 2018 and bachelor degree from Central South University, China, in Jul. 2016.
I mainly focus on low-level vision tasks, such as image dehazing, desnowing, deblurring, etc.
Thesis Topic
If you are interested in any low-level vision tasks, please contact me indicating your background and skills.
Professional Activities
Conference Reviewer:
- ECAI'23
- NeurIPS'23
- ICLR'24
- CVPR'24
Journal Reviewer:
- Knowledge-Based Systems
- IET Image Processing
- IEEE Transactions on Pattern Analysis and Machine Intelligence